lsoProfil supplies electroplated products made of metal and plastic for a wide range of applications - coated according to customers’ specifications:
We record the thickness of the layers using X-ray fluorescence spectroscopy. In X-ray fluorescence (XRF) is the characteristic emission of fluorescence from reference and analysis materials ‘excited’ by X-ray lines and spectrum retardation.
The radiation emanating from the sample is decomposed by monochromatisation performed by a crystal monochromator so that the intensities of individual spectral lines or ranges (wavelength dispersive) can be measured. After adjustments for matrix effects and line overlaps, the measured intensity of a line represents a measure of the concentration of the element.
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